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dc.contributor.authorMahariq, I.
dc.contributor.author Kuzuoğlu, M.
dc.contributor.author Tarman, I.H.
dc.contributor.author Kurt, Hamza
dc.date.accessioned2019-06-26T07:43:38Z
dc.date.available2019-06-26T07:43:38Z
dc.date.issued2014-09
dc.identifier.citationMahariq, I., Kuzuoğlu, M., Tarman, I. H., & Kurt, H. (2014). Photonic nanojet analysis by spectral element method. IEEE Photonics Journal, 6(5), 1-14.en_US
dc.identifier.issn19430655
dc.identifier.urihttps://ieeexplore.ieee.org/document/6916995?arnumber=6916995&tag=1
dc.identifier.urihttp://hdl.handle.net/20.500.11851/1356
dc.description.abstractAlthough it is known that the spectral element method (SEM) has both high accuracy and a lower computational cost when compared with finite-element or finite-difference methods, the SEM is not widely utilized in the modeling of boundary value problems in electromagnetics. This paper provides a 2-D formulation of the well-known perfectly-matched-layer approach in the context of the SEM for the frequency-domain electromagnetic problems in which dielectric scatterers are involved. The formulation is then utilized to numerically study photonic nanojets after the demonstration of SEM accuracy in an electromagnetic scattering problem. Interesting cases where unusual results are obtained from scattering dielectric cylinders are reported and discussed in this paper. On the other hand, a finite-difference time-domain method that is widely deployed for investigating photonic nanojets is found to fail in successfully capturing such resonance cases. Sharp resonances are characteristic of high-Q cavities and numerical methods with high accuracy, e.g., the SEM can provide superior performance while exploring such resonators. © 2009-2012 IEEE.en_US
dc.language.isoengen_US
dc.publisherInstitute Of Electrical And Electronics Engineers Inc.en_US
dc.rightsinfo:eu-repo/semantics/openAccess
dc.subjectMicrospheresen_US
dc.subjectphotonicsen_US
dc.subjectphotonic jeten_US
dc.titlePhotonic Nanojet Analysis by Spectral Element Methoden_US
dc.typearticleen_US
dc.rights.holder© 20XX IEEE.  Personal use of this material is permitted.  Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
dc.relation.journalIEEE Photonics Journalen_US
dc.contributor.departmentTOBB ETU, Faculty of Engineering, Department of Electrical & Electronics Engineeringen_US
dc.contributor.departmentTOBB ETÜ, Mühendislik Fakültesi, Elektrik ve Elektronik Mühendisliği Bölümütr_TR
dc.identifier.volume6
dc.identifier.issue5
dc.contributor.orcidhttps://orcid.org/0000-0002-0749-4205
dc.identifier.scopus2-s2.0-84940772109
dc.contributor.tobbetuauthorKurt, Hamza
dc.contributor.YOKid200103
dc.identifier.doi10.1109/JPHOT.2014.2361615
dc.contributor.ScopusAuthorID57189350201
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıtr_TR


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