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dc.contributor.authorSankır, Nurdan Demirci
dc.contributor.authorAydın, Erkan
dc.contributor.authorSankır, Mehmet
dc.date.accessioned2016-11-07 17:26:29
dc.date.available2019-02-21T13:11:17Z
dc.date.issued2014-04-14
dc.identifier.citationSankir, N. D., & Erkan Aydin, M. S. (2014). Impedance spectroscopy and dielectric properties of silver incorporated indium sulfide thin films. International Journal of Electrochemical Science, 9(7), 3864-3875.en_US
dc.identifier.urihttp://hdl.handle.net/20.500.11851/518
dc.description.abstractIn this study, silver incorporated indium sulfide (In2S3) thin films have been deposited on soda lime glass via spray pyrolysis technique. Structural and electrical properties have been tailored by adding controlled amount of silver acetate into the precursor solution. A phase shift form cubic -In2S3 to AgInS2 has been evidenced from X-ray diffraction spectra (XRD). Molecularity of the samples, meaning (Ag+In)/S ratio, has directly affected the electrical conductivity as well as the dielectric properties. Direct and alternating current conductivities increased with increasing the (Ag+In)/S ratio upto 10% silver incorporation. When the silver amount further increased conductivity decreased due to the pronounced secondary phase formation. The complex impedance analysis was used to determine the effect of silver on the conduction mechanism. It has been observed that frequency exponent of all samples were greater than unity indicating the nanocrystalline nature of the films. The variation of dielectric properties and ac conductivity with frequency revealed that the relaxation process in silver incorporated In2S3 thin films was due to the Maxwell–Wagner type of interfacial polarization in general.en_US
dc.language.isoengen_US
dc.rightsinfo:eu-repo/semantics/openAccessen_US
dc.source90703864.pdfen_US
dc.subjectSpray pyrolysisen_US
dc.subjectindium sulfideen_US
dc.subjectsilver incorporationen_US
dc.subjectimpedance spectroscopyen_US
dc.subjectdielectric propertiesen_US
dc.titleImpedance Spectroscopy and Dielectric Properties of Silver Incorporated Indium Sulfide Thin Filmsen_US
dc.typearticleen_US
dc.relation.journalInternational journal of electrochemical scienceenUS
dc.contributor.departmentTOBB ETÜ, Mühendislik Fakültesi, Malzeme Bilimi ve Nanoteknoloji Mühendisliği Bölümütr_TR
dc.identifier.volume9
dc.identifier.startpage3864
dc.identifier.endpage3875
dc.contributor.orcidhttps://orcid.org/0000-0002-7004-1217
dc.contributor.orcidhttps://orcid.org/0000-0003-2103-0439
dc.identifier.wosWOS:000336899000044
dc.identifier.scopus2-s2.0-84898616560
dc.contributor.tobbetuauthorSankır, Nurdan Demirci
dc.contributor.tobbetuauthorSankır, Mehmet
dc.relation.publicationcategoryMakale - Uluslararası Hakemli Dergi - Kurum Öğretim Elemanıtr_TR


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